FEI XL30 ESEM

In an Environmental Scanning Electron Microscope (ESEM) all specimens, wet/dry, conductive/insulating, can be examined in their natural state without the need for specimen preparation. In Wet mode, specimens can be examined at pressures up to 2600 Pa (3 nm resolution), in a variety of gaseous atmospheres and temperatures (-30°C to 1000°C). A unique application of ESEM is dynamic in-situ studies of surfaces during heating/freezing experiments in a variety of gaseous atmospheres and (de)hydration experiments.