Jeol 35CF SEM with XRM

The Jeol 35CF is a conventional thermionic Tungsten electron gun Scanning Electron Microscope equipped with:

• Secondary electron detector providing 6 nm spatial resolution
• Backscattered electron and absorbed current (for Electron Beam Induced Current) detectors
• Two Energy Dispersive X-ray Detectors with a Moran Scientific quantitative X-ray analysis and quantitative X-ray mapping system