JEOL 6300F SEM

The 6300 FEG SEM is a high resolution topographic and compositional imaging instrument with nanometer resolution. The 6300 FEG SEM can provide:

• Quantitative element analysis from Boron to Uranium.
• Full image processing and quantitative image analysis.
• Easy operation at 40,000X with auto CB, focus and astigmatism correction.
• Complete operation control via keyboard or digital control knobs.
• Analysis of non-conductive specimens at low kV, uncoated.
• High spatial resolution secondary electron imaging (1.5 nm at 30 kV)
• High spatial resolution backscattered electron imaging (3 nm at 30 kV)
• X-ray mapping and line-profiles using Moran Scientific software package