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Primary staff contact for the following instruments:
- Zeiss Supra 55VP Scanning Electron Microscope
- Raith Elphy Nanolithography System
- Oxford EDS/XRM microanalysis system
- HKL EBSD System
- JEOL 35CF SEM with Moran Dual X-ray Mapping System
- JEOL 35C SEM with EDS/WDS X-ray Mapping
- JEOL 6300F SEM
Research Interests:
- Materials characterisation, materials science and materials chemistry
- Microcharacterisation of materials using x-ray diffraction, electron microscopy and microanalysis techniques
- X-Ray Mapping (XRM), electron back-scattered diffraction (EBSD), particle analysis and characterisation, and nano-lithography
- Surface coatings/engineering
- Development and characterisation of new thin film coatings (CrAlN, TiAlN, multilayers) for varying applications
- Metal Matrix Composities
Recent publications:
J. Mak, R. Wuhrer, N. Booth, P. Fanos, G. Heness and W. Y. Yeung, Equal channel angular extrusion of Zinc-Aluminium metal matrix composites, 10th International Conference on Mechanical Behavior of Materials, May 27-31, 2007 Busan South Korea, Mechanical Behaviour of Materials X, Parts 1and 2, Volume 345-346, Pages113-116, Part: 1-2, Published: 2007.
M. Wintrebert-Fouquet, K. S. A. Butcher, P. P.-T. Chen and R. Wuhrer, “Nitride film growth morphology using remote plasma enhanced chemical vapor deposition” phys. stat. sol. (c) 4 , No. 7, 2285–2288 (2007)
R. Wuhrer and W. Y. Yeung, “Modelling of Nitrogen Deposition Pressure Effect on Grain Size Development and Mechanical Properties of Nanocrystalline ternary Nitride Coatings”, Materials Science Forum Vols. 539-543 (2007) pp. 1177-1182
J. Chou, B. Ben-Nissan, A. Choi, R. Wuhrer and D. Green, “Conversion of Coral Sand to Calcium Phosphate for Biomedical Applications”, Journal of Australian Ceramic Society, 44, 1 (2007), p44.
R. White, P. S. Thomas, M. R. Philips, R. Wuhrer and J. P. Guerbois, “TG-MS Charaterization of the Reaction Products of Cadmium Yellow and Malachite Artists Pigments”, Journal of Thermal Analysis and Calorimetry, Vol. 88 (2007) 1, 181–184.
R. Wuhrer and K. Moran, “Representation of Microstructures through Rapid X-Ray Mapping”, Materials Australia, Volume 38, No 5, September-October (2006) 12-14.
Patrick P.-T. Chen, K. Scott A. Butcher, Marie Wintrebert-Fouquet, Richard Wuhrer, Matthew R. Phillips, Kathryn. E. Prince, Heiko Timmers, Santosh K. Shrestha, Brian F. Usher, “Apparent band-gap shift in InN films grown by remote-plasma-enhanced CVD” Journal of Crystal Growth 288 (2006) 241–246.
Mi Jung Choi, Andrew M. McDonagh, Philip J. Maynard, Richard Wuhrer, Chris Lennard and Claude Roux, “Preparation and Evaluation of Metal Nanopowders for the Detection of Fingermarks on Nonporous Surfaces”, Journal of Forensic Identification, 756 / 56 (5), 2006.
S.H.N. Lim, D.G. McCulloch, M.M.M. Bilek, D.R. McKenzie, J. du Plessis, M.V. Swain and R. Wuhrer,”The effect of plasma immersion ion implantation on the contact pressure and composition of titanium nitride thin films”, Surface and Coatings Technology, 201 (2006) 396-400.
Mi Jung Choi, Katie E. McBean, Richard Wuhrer, Andrew M. McDonagh, Philip J. Maynard, Chris Lennard and Claude Roux, “Investigation into the Binding of Gold Nanoparticles to Fingermarks Using Scanning Electron Microscopy”, Journal of Forensic Identification, 24 / 56 (1), 2006.
R. Wuhrer and W. Y. Yeung, “A quantitative modelling on reactive magnetron co-sputtering of nanocrystalline ternary nitride coatings” Submitted to Journal Materials Science 2006.
P. G. Huggett, R. Wuhrer, B. Ben-Nissan and K. Moran, “Composite Alloy Wear Parts for Use in the Mining Industry”, Materials Forum, Volume 30, (2006) 23-29.
R. Wuhrer, K. Moran and L. Moran, “Characterisation of Materials through X-ray Mapping”, Materials Forum, Volume 30, (2006) 63-70.
R. Wuhrer, M. Lee, K. Moran and W. Y. Yeung, “X-ray Mapping of Metallic Elements in Roll Bonded Metal Laminates”, Materials Forum, Volume 30, (2006) 225-232.
W. Y. Yeung, R. Wuhrer and D.J. Attard, “High Temperature Behaviour of Magnetron Sputtered Nanocrystalline Titanium Aluminium Nitride Coatings”, Materials Forum, Volume 30, (2006) 77-84.
K. Moran and R. Wuhrer, “Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors”, Mikrochimica Acta, Vol. 155, pp. 59-66 (2006)..
K. Moran and R. Wuhrer, “X-ray Mapping and Interpretation of Scatter Diagrams”, Mikrochimica Vol. 155, pp. 209-217 (2006).
. R. White, M. R. Phillips, P. Thomas and R. Wuhrer, “In-Situ Investigation of Discolouration Processes Between Historic Oil Paint Pigments”, Mikrochimica Acta, April 28, 2006.
P. P. T. Chen, K. S. A. Butcher, M. Wintrebert-Fouquet, R. Wuhrer, M. R. Phillips, K. E. Prince, H. Timmers, S. K. Shrestha, B. F. Usher, “Apparent band-gap shift in InN films grown by remote-plasma-enhanced CVD”, Journal of Crystal Growth 288 (2006) 241–246.
M. J. Choi, K. E. McBean, R. Wuhrer, A. M. McDonagh, P. J. Maynard, C. Lennard and C. Roux, “Investigation into the Binding of Gold Nanoparticles to Fingermarks Using Scanning Electron Microscopy”, Journal of Forensic Identification, 24/56 (1), 2006.
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