Spectroscopy

Perkin Elmer LS50 Luminescence Spectrometer

Description: Excitation and Emission monochromators can be scanned over their ranges independently, synchronously or driven to selected points in their ranges.

• Excitation Monochromator Range: 200 nm – 800 nm and zero order

• Emission Monochromator Range: 200 nm – 900 nm and zero order

• Resolution (increments of 0.1 nm): 2.5 nm – 15 nm (Ex) 2.5 nm – 20 nm (Em).

Capabilities: Fluorescence, Phosphorescence and Chemi- or Bioluminescence. Solid and liquid sample holder.

Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer

Description: Double beam, double monochromator, ratio recording spectrophotometer controlled by a PC.

• Wavelength Range: 175nm – 3300 nm

• UV/VIS Resolution: ≤ 0.05 nm

• NIR Resolution: ≤ 0.20 nm

Capabilities: Transmittance, absorbance, absolute and variable angle specular reflectance measurements. Solid and liquid sample holders.

Varian Cary 5E UV/VIS/NIR Spectrometer

Description: Double beam, double monochromator, ratio recording spectrophotometer controlled by a PC.

•       Wavelength Range: 175 nm – 3300 nm

•       Resolution: 0.05 nm

Capabilities: Transmittance, Absorbance, absolute and variable angle specular reflectance measurements. Solid and liquid sample holders. Extended sample chamber for large samples. Purpose built heating system for thin films.

Ocean Optics SD2000 Diode Array Spectrometer

Description: Compact plug in fibre optic UV-VIS spectrometer with fixed grating and 2048-element linear CCD-array detector.

• Wavelength Range:  360 – 1000 nm.

Capabilities: Sampling Optics: Integrating Sphere (1.5” diam). Measurement of Diffuse and Specular Reflectance.

J-Y Instruments Phase Modulated Ellipsometer

Description: High frequency modulation provided by a photo-elastic modulator. Variable angle of incidence goniometer: automatic from 10° to 90°.

• Spectral Range: 240 – 850 nm

• Resolution: < 0.1 nm at 500 nm (1200 grooves/mm grating).

• Goniometer setting accuracy: better than 0.05°.

Capabilities: Measures changes in phase and amplitude of polarised reflected light. Modelling of data (using the WVASE32 ellipsometric software package developed by J.A Woollam Co. Inc.) yields either thin film thickness or optical constants (‘n’ and ‘k’).