X-ray Photoelectron Spectroscopy (XPS) is a quantitative spectroscopic technique that measures the empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analysed. XPS requires ultra-high vacuum (UHV) conditions.

• Un-monochromated Al and Mg X-ray source
• Single sample
• Ion gun etching
• Sample heating and cooling