Facilities

The MAU is comprised of five separate characterisation nodes;

1. Electron microscopy and microanalysis
2. Scanning probe microscopy
3. X-ray characterisation
4. Electrical measurement and characterisation
5. Optical characterisation

As well as a materials fabrication and processing equipment suite. This research infrastructure is supported by an academic Director, a Research Laboratory Manager and three highly experienced and highly skilled Professional Officers.

A comprehensive list of the MAU's equipment is given below.

Scanning electron microscopes (SEM)

• Zeiss Supra 55VP SEM with RAITH E-beam Lithography System & EBSD
• FEI XL30 ESEM
• FEI Quanta 200 ESEM with Cathodoluminescence (CL) Spectroscopy and Moran Scientific CL Mapping System
• JEOL 35CF SEM with Moran Scientific Dual Detector EDS X-ray Mapping System
• FEI Nova NanoSEM

 SEM Accessories

• Kleindiek Nanomanipulators

 Scanning probe microscopes (SPM)

• Digital Instruments Dimension™ 3100 AFM and Bioscope
• Digital Instruments Multimode SPM
• Nanosurf Easyscan E-STM

 X-ray diffraction (XRD)

• Siemens D5000 Diffractometer

 Spectroscopy

• Varian Cary Eclipse Fluorescence Spectrometer
• Perkin Elmer LS50 Luminescence Spectrometer
• Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer
• Varian Cary 5E UV/VIS/NIR Spectrometer
• Ocean Optics SD2000 Diode Array Spectrometer

Thin film coating chambers

• Edwards EO6 Deposition System
• Denton DV502 Turbo Deposition System
• Dynavac CE12-14s Evaporation System
• Shannon E-beam Evaporation System

To find out how to gain access to these research instruments and MAU, visit user access and registration in this website.