Scanning probe microscopes (SPM)
Digital Instruments Dimension™ 3100 AFM
The Dimension™ 3100 is a very versatile scanning probe microscope that can operate in a number of modes, e.g. contact, tapping, STM, EMF, Force volume etc.
It has a maximum lateral scan range of 100 x 100 micrometers and has around 5 micrometers in the Z (vertical) direction.
The sample stage can accommodate large specimens up to 15 cm in breadth and the on board video camera allows easy surface inspection and precise tip positioning.
A wet cell also enables the imaging of biological samples while in buffered solution.
Digital Instruments Multimode Scanning Probe Microscope with Conductive AFM
The Digital Instruments Multimode Scanning Probe Microscope is a low noise, high resolution scanning probe microscope that can image down to the atomic scale with ease.
It operates in a number of modes, e.g. contact, tapping, STM, EMF, Force volume and CAFM. It has a maximum lateral scan range of 12 x 12 micrometers and has around 3 micrometers in the Z (vertical) direction.
"CAFM" is short for conductive atomic force microscope. The tip is scanned as in contact mode, with a bias being applied to either tip or sample. With a current sensitivity down to pico amps, it has the ability to map conductivity of surfaces, or to perform current-voltage spectroscopy at features of interest.
The sample stage can accommodate specimens up to 12 mm in breadth.
A wet cell also enables the imaging of biological samples while in buffered solution.
Nanosurf Easyscan Tunnelling microscope
The NANOSURF EASYSCAN is a dedicated low noise, high-resolution scanning tunnelling microscope (STM). The primary use of this instrument is for the characterisation of surfaces at the atomic or molecular scale.
Its maximum lateral scan range is 250 x 250 nm whilst its maximum Z (vertical) range is 200 nm. The maximum size of samples that can be accommodated is around 7 mm in diameter.
